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Microelectronics failure analysis desk reference /
Published 2011An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
23
ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA...
Published 2011An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
24
ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Published 2012An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
25
ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, US...
Published 2013An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
26
ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas,...
Published 2014An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
27
ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Published 2015An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
28
Electronic structure of materials : challenges and developments /
Published 2019Taylor & Francis
OCLC metadata license agreement
Electronic eBook -
29
Electrical and electronic devices, circuits and materials : design and applications /
Published 2021Taylor & Francis
OCLC metadata license agreement
Electronic eBook