Suggested Topics within your search.
Showing 1 - 2 results of 2 for search 'Artech House,', query time: 0.01s Refine Results
  1. 1
    Wafer-level testing and test during burn-in for integrated circuits

    Wafer-level testing and test during burn-in for integrated circuits by Bahukudumbi, Sudarshan

    Published 2010
    “…Artech House,…”
    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook
    Save to List
    Saved in:
  2. 2
    Adaptive cooling of integrated circuits using digital microfluidics

    Adaptive cooling of integrated circuits using digital microfluidics by Paik, Philip Y.

    Published 2007
    “…Artech House,…”
    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook
    Save to List
    Saved in:

Search Tools: