Author
- ebrary, Inc 18 results
- Electronic Device Failure Analysis Society 4 results
- Alquier, Daniel 2 results
- Asomoza, René 2 results
- Brillson, L. J. 2 results
- Chen, Jr-Tai 2 results
- El-Atab, Nazek 2 results
- Feng, Zhe Chuan 2 results
- Hussain, Muhammad Mustafa 2 results
- International Materials Research Congress 2 results
- International Symposium for Testing and Failure Analysis Portland, Oregon 2 results
- Li, Peng 2 results
- Morkoç, Hadis 2 results
- Onur Topaloglu, Rasit 2 results
- Orton, J. W. (John Wilfred) 2 results
- Pizzini, Sergio 2 results
- Ross, Richard J. 2 results
- Sharon, Maheshwar 2 results
- Velumani, S. 2 results
- Wong, Terence K. S. 2 results
- Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications Nice, France 2 results
- Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications Tours, France 2 results
- Yao, Jiannian, 1953- 2 results
- Zhai, Tianyou, 1980- 2 results