Digital Rubbish : A Natural History of Electronics /
"This is a study of the material life of information and its devices; of electronic waste in its physical and electronic incarnations; a cultural and material mapping of the spaces where electronics in the form of both hardware and information accumulate, break down, or are stowed away. Electro...
Guardat en:
| Autor principal: | |
|---|---|
| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
Ann Arbor :
University of Michigan Press,
[2011]
|
| Col·lecció: | Book collections on Project MUSE.
|
| Matèries: | |
| Accés en línia: | Full text available: |
| Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|
Ítems similars
Digital rubbish natural history of electronics /
per: Gabrys, Jennifer
Publicat: (2011)
per: Gabrys, Jennifer
Publicat: (2011)
High tech trash digital devices, hidden toxics, and human health /
per: Grossman, Elizabeth, 1957-
Publicat: (2006)
per: Grossman, Elizabeth, 1957-
Publicat: (2006)
Electronic components and processes
per: Maheshwari, Preeti
Publicat: (2006)
per: Maheshwari, Preeti
Publicat: (2006)
Solid state electronic devices /
per: Streetman, Ben G.
Publicat: (2010)
per: Streetman, Ben G.
Publicat: (2010)
Guide to state-of-the-art electron devices
Publicat: (2013)
Publicat: (2013)
Electronic : devices and circuits /
per: Kulshreshtha, D. c.
Publicat: (2006)
per: Kulshreshtha, D. c.
Publicat: (2006)
Novel architectures for flexible electrochemical devices and systems
per: Kawahara, Jun
Publicat: (2013)
per: Kawahara, Jun
Publicat: (2013)
Electronic materials science
per: Irene, Eugene A.
Publicat: (2005)
per: Irene, Eugene A.
Publicat: (2005)
Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
per: Karris, Steven T.
Publicat: (2012)
per: Karris, Steven T.
Publicat: (2012)
A designer's guide to built-in self-test
per: Stroud, Charles E.
Publicat: (2002)
per: Stroud, Charles E.
Publicat: (2002)
Polymers for electricity and electronics materials, properties, and applications /
per: Drobny, Jiri George
Publicat: (2012)
per: Drobny, Jiri George
Publicat: (2012)
Hertzian tales electronic products, aesthetic experience, and critical design /
per: Dunne, Anthony
Publicat: (2005)
per: Dunne, Anthony
Publicat: (2005)
Parts selection and management
Publicat: (2004)
Publicat: (2004)
Electronic devices : a text and software problems manual /
per: Schultz, Mitchel E.
Publicat: (1994)
per: Schultz, Mitchel E.
Publicat: (1994)
Electrical characterization of organic electronic materials and devices
per: Stallinga, Peter, 1966-
Publicat: (2009)
per: Stallinga, Peter, 1966-
Publicat: (2009)
ESD basics from semiconductor manufacturing to use /
per: Voldman, Steven H.
Publicat: (2012)
per: Voldman, Steven H.
Publicat: (2012)
Introduction to microfabrication
per: Franssila, Sami
Publicat: (2010)
per: Franssila, Sami
Publicat: (2010)
ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Publicat: (1999)
Publicat: (1999)
ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Publicat: (1997)
Publicat: (1997)
ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Publicat: (1998)
Publicat: (1998)
ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Publicat: (2004)
Publicat: (2004)
ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Publicat: (2001)
Publicat: (2001)
ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Publicat: (1996)
Publicat: (1996)
ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Publicat: (2003)
Publicat: (2003)
ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Publicat: (2008)
Publicat: (2008)
ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Publicat: (2002)
Publicat: (2002)
ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Publicat: (2007)
Publicat: (2007)
ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Publicat: (2000)
Publicat: (2000)
ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Publicat: (2005)
Publicat: (2005)
ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Publicat: (2010)
Publicat: (2010)
ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Publicat: (2009)
Publicat: (2009)
ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Publicat: (2011)
Publicat: (2011)
ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Publicat: (2012)
Publicat: (2012)
ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Publicat: (2013)
Publicat: (2013)
ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Publicat: (2014)
Publicat: (2014)
Polymers for electronic components a Rapra industry analysis report /
per: Cousins, Keith
Publicat: (2001)
per: Cousins, Keith
Publicat: (2001)
Design for at-speed test, diagnosis, and measurement
Publicat: (2000)
Publicat: (2000)
EMC for product designers
per: Williams, Tim, 1954-
Publicat: (2007)
per: Williams, Tim, 1954-
Publicat: (2007)
Designing the internet of things /
per: McEwen, Adrian
Publicat: (2014)
per: McEwen, Adrian
Publicat: (2014)
Single-electron devices and circuits in silicon
per: Durrani, Zahid Ali Khan
Publicat: (2010)
per: Durrani, Zahid Ali Khan
Publicat: (2010)