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Characterization of tribological materials

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其他作者: Glaeser, William A.
格式: 电子 电子书
语言:英语
出版: [New York, N.Y.] (222 East 46th Street, New York, NY 10017) : Momentum Press, c2013.
版:2nd ed.
丛编:Materials characterization series.
主题:
Tribology.
Materials > Mechanical properties.
tribology
surface contact
surface analytical techniques
wear and failure
wear scar analysis
atomic force microscope
nano-friction
nano-tribology
nano-hardness
Environmental SEM (ESEM)
microtopography of surface roughness
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书本目录:
  • Preface to the second edition
  • Preface to the reissue of the Materials characterization series
  • Preface to series
  • Preface to the reissue of Characterization of tribological materials
  • Preface
  • Acronyms
  • Contributors
  • [1.] Introduction
  • [2.] The role of adhesion in wear
  • 2.1 Introduction
  • 2.2 Considerations for experiments
  • Background
  • Macroscopic experiments
  • Atomic level experiments
  • Microscopic contacts
  • 2.3 Theoretical considerations at the atomic level
  • Background for theory
  • Universal binding energy relation
  • Semiempirical methods
  • 2.4 Conclusions
  • References
  • [3.] Friction
  • 3.1 Introduction
  • 3.2 Sliding friction
  • Basic concepts
  • The dual nature of frictional process
  • Phenomenology of friction process
  • Real area of contact
  • Adhesion component of friction
  • The interface shear stress
  • Deformation component of friction
  • Viscoelastic component of friction
  • Friction under boundary lubrication conditions
  • Phenomena associated with friction
  • 3.3 Rolling friction
  • Review of rolling friction hypotheses
  • Free rolling
  • 3.4 Exceptional friction processes
  • 3.5 Conclusions
  • References
  • [4.] Adhesive wear
  • 4.1 Introduction
  • 4.2 Surface analysis
  • 4.3 Auger analysis of worn surfaces after "unlubricated wear"
  • 4.4 In situ systems
  • 4.5 Conclusions
  • References
  • [5.] Abrasive wear
  • 5.1 Abrasive asperities and grooves
  • 5.2 Yield criterion of an abrasive asperity
  • Abrasive wear mode diagram
  • 5.3 Degree of wear at one abrasive groove
  • 5.4 Macroscopic wear in multiple abrasive sliding contacts
  • References
  • [6.] Boundary lubrication
  • 6.1 Introduction
  • 6.2 Mechanical effects in lubrication
  • 6.3 Adequacy of hydrodynamic fluid films
  • 6.4 Chemical effects in liquid lubrication, boundary lubrication
  • 6.5 Wear and failure
  • 6.6 Research in boundary lubrication
  • 6.7 Laboratory research
  • 6.8 Composition of films
  • 6.9 Further mechanical effects of the boundary lubricant layer
  • 6.10 Surface analysis of boundary lubricated metals
  • 6.11 Ellipsometry and its use in measuring film thickness
  • References
  • [7.] Magnetic recording surfaces
  • 7.1 Introduction
  • 7.2 Magnetic storage systems
  • 7.3 Wear mechanisms
  • Head-(particulate) tape interface
  • Head-(particulate) rigid disk interface
  • Head-(thin-film) rigid disk interface
  • 7.4 Lubrication mechanisms
  • Measurement of localized lubricant film thickness
  • Lubricant-disk surface interactions
  • Lubricant degradation
  • References
  • [8.] Surface analysis of precision ball bearings
  • 8.1 Introduction
  • 8.2 Disassembly
  • Examination, optical microscopy, and photography
  • Gas analysis by mass spectrometry
  • Lubricant analysis and removal
  • 8.3 Microexamination
  • Scanning electron microscopy
  • Profilometry
  • 8.4 Surface analysis
  • Auger electron spectroscopy
  • Photoelectron spectroscopy
  • SIMS
  • Vibrational spectroscopy
  • 8.5 Future directions
  • Acknowledgments
  • References
  • [9.] Atomic force microscope nanofriction
  • 9.1 Introduction
  • 9.2 Description
  • 9.3 Friction measurements
  • 9.4 Uses
  • 9.5 Kelvin probe application
  • References
  • Appendices: technique summaries
  • Light microscopy
  • Scanning electron microscopy (SEM)
  • In situ wear device for the scanning electron microscope
  • Scanning tunneling microscopy and scanning force microscopy (STM and SFM)
  • Transmission electron microscopy (TEM)
  • Energy-dispersive x-ray spectroscopy (EDS)
  • Scanning transmission electron microscopy (STEM)
  • Electron probe x-ray microanalysis (EPMA)
  • X-ray diffraction (XRD)
  • Low-energy electron diffraction (LEED)
  • X-ray photoelectron spectroscopy (XPS)
  • Auger electron spectroscopy (AES)
  • Fourier transform infrared spectroscopy (FTIR)
  • Raman spectroscopy
  • Rutherford backscattering spectrometry (RBS)
  • Static secondary ion mass spectrometry (static SIMS)
  • Surface roughness: measurement, formation by sputtering, impact on depth profiling
  • Index.

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