System-on-chip test architectures nanometer design for testability /
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| Korporativna značnica: | |
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| Drugi avtorji: | , , |
| Format: | Elektronski eKnjiga |
| Jezik: | angleščina |
| Izdano: |
Amsterdam ; Boston :
Morgan Kaufmann Publishers,
c2008.
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| Serija: | Morgan Kaufmann series in systems on silicon.
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| Teme: | |
| Online dostop: | An electronic book accessible through the World Wide Web; click to view |
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