System-on-chip test architectures nanometer design for testability /

Furkejuvvon:
Bibliográfalaš dieđut
Searvvušdahkki: ebrary, Inc
Eará dahkkit: Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Materiálatiipa: Elektrovnnalaš E-girji
Giella:eaŋgalasgiella
Almmustuhtton: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Ráidu:Morgan Kaufmann series in systems on silicon.
Fáttát:
Liŋkkat:An electronic book accessible through the World Wide Web; click to view
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