System-on-chip test architectures nanometer design for testability /

Gardado en:

Detalles Bibliográficos
Autor Corporativo:	ebrary, Inc
Outros autores:	Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Series:	Morgan Kaufmann series in systems on silicon.
Subjects:	Systems on a chip > Testing. Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
Tags:	Engadir etiqueta Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!

Internet