System-on-chip test architectures nanometer design for testability /

Sábháilte in:
Sonraí bibleagrafaíochta
Údar corparáideach: ebrary, Inc
Rannpháirtithe: Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Formáid: Leictreonach Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Sraith:Morgan Kaufmann series in systems on silicon.
Ábhair:
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