VLSI test principles and architectures design for testability /

VLSI test principles and architectures design for testability /

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Bibliographic Details
Other Authors: Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Format: Electronic eBook
Language:English
Published: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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