कवर छवि

क्यूआर कोड

Comprehensive functional verification the complete industry cycle

अन्य संस्करण दिखाएं (1)

में बचाया:

ग्रंथसूची विवरण
मुख्य लेखक:	Wile, Bruce
निगमित लेखक:	ebrary, Inc
अन्य लेखक:	Goss, John C., Roesner, W. (Wolfgang)
स्वरूप:	इलेक्ट्रोनिक ई-पुस्तक
भाषा:	अंग्रेज़ी
प्रकाशित:	Amsterdam ; Boston : Elsevier/Morgan Kaufmann, c2005.
विषय:	Integrated circuits > Verification. Computer engineering. Electronic books.
ऑनलाइन पहुंच:	An electronic book accessible through the World Wide Web; click to view
टैग:	टैग जोड़ें कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!

समान संसाधन

Comprehensive functional verification the complete industry cycle
द्वारा: Wile, Bruce
प्रकाशित: (2005)

Verification by error modeling using testing techniques in hardware verification /
द्वारा: Radecka, Katarzyna
प्रकाशित: (2003)

Verification by error modeling using testing techniques in hardware verification /
द्वारा: Radecka, Katarzyna
प्रकाशित: (2003)

Verification of systems and circuits using LOTOS, Petri Nets, and CCS
द्वारा: Yoeli, Michael, 1917-
प्रकाशित: (2008)

Verification of systems and circuits using LOTOS, Petri Nets, and CCS
द्वारा: Yoeli, Michael, 1917-
प्रकाशित: (2008)

Verification techniques for system-level design
द्वारा: Fujita, Masahiro, 1956-
प्रकाशित: (2008)

Verification techniques for system-level design
द्वारा: Fujita, Masahiro, 1956-
प्रकाशित: (2008)

Compact models for integrated circuit design : conventional transistors and beyond /
द्वारा: Saha, Samar K.
प्रकाशित: (2016)

Compact models for integrated circuit design : conventional transistors and beyond /
द्वारा: Saha, Samar K.
प्रकाशित: (2016)

VLSI circuits for biomedical applications
प्रकाशित: (2008)

VLSI circuits for biomedical applications
प्रकाशित: (2008)

Digital circuit analysis and design with simulink modeling
द्वारा: Karris, Steven T.
प्रकाशित: (2007)

CMOS RFIC design principles
द्वारा: Caverly, Robert
प्रकाशित: (2007)

CMOS RFIC design principles
द्वारा: Caverly, Robert
प्रकाशित: (2007)

Digital circuit analysis and design with simulink modeling
द्वारा: Karris, Steven T.
प्रकाशित: (2007)

Understanding fabless IC technology
द्वारा: Hurtarte, Jeorge S.
प्रकाशित: (2007)

Understanding fabless IC technology
द्वारा: Hurtarte, Jeorge S.
प्रकाशित: (2007)

Alternative computer chips post-silicon circuits.
प्रकाशित: (2003)

Computer chips post-Moore's-law possibilities.
प्रकाशित: (2003)

Computer chips post-Moore's-law possibilities.
प्रकाशित: (2003)

Alternative computer chips post-silicon circuits.
प्रकाशित: (2003)

Computer chips post-Moore's-law possibilities.
प्रकाशित: (2003)

Computer chips post-Moore's-law possibilities.
प्रकाशित: (2003)

Beweiseignung : fortgeschrittener elektronischer signaturen /
द्वारा: Grigorjew, Olga
प्रकाशित: (2015)

Beweiseignung : fortgeschrittener elektronischer signaturen /
द्वारा: Grigorjew, Olga
प्रकाशित: (2015)

Wafer-level testing and test during burn-in for integrated circuits
द्वारा: Bahukudumbi, Sudarshan
प्रकाशित: (2010)

Advanced interconnects for ULSI technology
प्रकाशित: (2012)

Wafer-level testing and test during burn-in for integrated circuits
द्वारा: Bahukudumbi, Sudarshan
प्रकाशित: (2010)

Advanced interconnects for ULSI technology
प्रकाशित: (2012)

Adaptive cooling of integrated circuits using digital microfluidics
द्वारा: Paik, Philip Y.
प्रकाशित: (2007)

Adaptive cooling of integrated circuits using digital microfluidics
द्वारा: Paik, Philip Y.
प्रकाशित: (2007)

Designing bipolar transistor radio frequency integrated circuits
द्वारा: Sweet, Allen A., 1943-
प्रकाशित: (2008)

Designing bipolar transistor radio frequency integrated circuits
द्वारा: Sweet, Allen A., 1943-
प्रकाशित: (2008)

Linear integrated circuits /
द्वारा: Choudhury, D. Roy
प्रकाशित: (2017)

Linear integrated circuits /
द्वारा: Choudhury, D. Roy
प्रकाशित: (2017)

System-level design with Rosetta
द्वारा: Alexander, Perry
प्रकाशित: (2007)

System-level design with Rosetta
द्वारा: Alexander, Perry
प्रकाशित: (2007)

Mixed analog-digital VLSI devices and technology
द्वारा: Tsividis, Yannis
प्रकाशित: (2002)

Mixed analog-digital VLSI devices and technology
द्वारा: Tsividis, Yannis
प्रकाशित: (2002)

VLSI test principles and architectures design for testability /
प्रकाशित: (2006)