Scanning force microscopy with applications to electric, magnetic, and atomic forces /
Wedi'i Gadw mewn:
| Prif Awdur: | |
|---|---|
| Awdur Corfforaethol: | |
| Fformat: | Electronig eLyfr |
| Iaith: | Saesneg |
| Cyhoeddwyd: |
New York :
Oxford University Press,
1994.
|
| Rhifyn: | Rev. ed. |
| Cyfres: | Oxford series in optical and imaging sciences ;
5. |
| Pynciau: | |
| Mynediad Ar-lein: | An electronic book accessible through the World Wide Web; click to view |
| Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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