ebrary, Inc, Browning, N. D., & Pennycook, S. J. (2000). Characterization of high Tc materials and devices by electron microscopy. Cambridge University Press.
芝加哥风格引文ebrary, Inc, Nigel D. Browning, 与 Stephen J. Pennycook. Characterization of High Tc Materials and Devices by Electron Microscopy. Cambridge ; New York: Cambridge University Press, 2000.
MLA引文ebrary, Inc, et al. Characterization of High Tc Materials and Devices by Electron Microscopy. Cambridge University Press, 2000.
警告：这些引文格式不一定是100％准确.