ebrary, Inc, Browning, N. D., & Pennycook, S. J. (2000). Characterization of high Tc materials and devices by electron microscopy. Cambridge University Press.
Chicago Style (17th ed.) Citationebrary, Inc, Nigel D. Browning, and Stephen J. Pennycook. Characterization of High Tc Materials and Devices by Electron Microscopy. Cambridge ; New York: Cambridge University Press, 2000.
MLA引文ebrary, Inc, et al. Characterization of High Tc Materials and Devices by Electron Microscopy. Cambridge University Press, 2000.
警告:這些引文格式不一定是100%准確.