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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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Sonraí bibleagrafaíochta
Príomhchruthaitheoir:	Wolstenholme, John (Údar)
Formáid:	Leictreonach Ríomhleabhar
Teanga:	Béarla
Foilsithe / Cruthaithe:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Sraith:	Materials characterization and analysis collection.
Ábhair:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
Rochtain ar líne:	An electronic book accessible through the World Wide Web; click to view
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

Íomhá chlúdaigh

Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / de réir Wolstenholme, John

Foilsithe / Cruthaithe 2015

An electronic book accessible through the World Wide Web; click to view

Leictreonach Ríomhleabhar