Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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书目详细资料
Main Authors:	Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, J. Moises (Author)
格式:	电子电子书
语言:	英语
出版:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
主题:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
在线阅读:	An electronic book accessible through the World Wide Web; click to view
标签:	添加标签没有标签, 成为第一个标记此记录!

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