Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Bibliografske podrobnosti
Main Authors:	Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, J. Moises (Author)
Format:	Elektronski eKnjiga
Jezik:	angleščina
Izdano:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Teme:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
Online dostop:	An electronic book accessible through the World Wide Web; click to view
Oznake:	Označite Brez oznak, prvi označite!

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