Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Ngā kaituhi matua:	Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, J. Moises (Author)
Hōputu:	Tāhiko īPukapuka
Reo:	Ingarihi
I whakaputaina:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Ngā marau:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
Urunga tuihono:	An electronic book accessible through the World Wide Web; click to view
Ngā Tūtohu:	Tāpirihia he Tūtohu Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!

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