Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Bibliografski detalji
Glavni autori:	Servín, Manuel (Autor), Quiroga, J. Antonio (Autor), Padilla, J. Moises (Autor)
Format:	Elektronički e-knjiga
Jezik:	engleski
Izdano:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Teme:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
Online pristup:	An electronic book accessible through the World Wide Web; click to view
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