Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

Saved in:

Bibliografiske detaljer
Main Authors:	Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, J. Moises (Author)
Format:	Electronisk eBog
Sprog:	engelsk
Udgivet:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Fag:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
Online adgang:	An electronic book accessible through the World Wide Web; click to view
Tags:	Tilføj Tag Ingen Tags, Vær først til at tagge denne postø!

Internet