Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Bibliographic Details
Main Authors: Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, J. Moises (Author)
Format: Electronic eBook
Language:English
Published: Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Subjects:
Diffraction patterns > Data processing.
Image processing > Data processing.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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