Reliability of MEMS testing of materials and devices /
Saved in:
Corporate Author: | ebrary, Inc |
---|---|
Other Authors: | Tabata, Osamu, Tsuchiya, Toshiyuki |
Format: | Electronic eBook |
Language: | English |
Published: |
Weinheim :
Wiley-VCH,
2013.
|
Series: | Advanced micro & nanosystems.
|
Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Reliability of MEMS testing of materials and devices /
Published: (2013) -
Understanding MEMS : principles and applications /
by: Castañer, Luis
Published: (2016) -
Understanding MEMS : principles and applications /
by: Castañer, Luis
Published: (2016) -
Hermeticity testing of MEMS and microelectronic packages /
by: Costello, Suzanne, et al.
Published: (2013) -
Hermeticity testing of MEMS and microelectronic packages /
by: Costello, Suzanne, et al.
Published: (2013)