ebrary, Inc, Tabata, O., & Tsuchiya, T. (2013). Reliability of MEMS: Testing of materials and devices. Wiley-VCH.
芝加哥风格引文ebrary, Inc, Osamu Tabata, 与 Toshiyuki Tsuchiya. Reliability of MEMS: Testing of Materials and Devices. Weinheim: Wiley-VCH, 2013.
MLA引文ebrary, Inc, et al. Reliability of MEMS: Testing of Materials and Devices. Wiley-VCH, 2013.
警告：这些引文格式不一定是100％准确.