Transmission electron microscopy in micro-nanoelectronics
Saved in:
Corporate Author: | ebrary, Inc |
---|---|
Other Authors: | Claverie, A. (Alain) |
Format: | Electronic eBook |
Language: | English |
Published: |
Hoboken, N.J. : London :
John Wiley &Sons, Inc., ; ISTE,
2013.
|
Series: | Nanoscience and nanotechnology series
|
Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Transmission electron microscopy in micro-nanoelectronics
Published: (2013) -
Aberration-corrected analytical transmission electron microscopy
Published: (2011) -
Aberration-corrected analytical transmission electron microscopy
Published: (2011) -
High-resolution electron microscopy
by: Spence, John C. H.
Published: (2009) -
High-resolution electron microscopy
by: Spence, John C. H.
Published: (2009)