Haugstad, G. (2012). Atomic force microscopy: Exploring basic modes and advanced applications. John Wiley & Sons.
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Citação norma Chicago
Haugstad, Greg. Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications. Hoboken, N.J.: John Wiley & Sons, 2012.
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Citação norma MLA
Haugstad, Greg. Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications. John Wiley & Sons, 2012.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.