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ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /

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-д хадгалсан:

Номзүйн дэлгэрэнгүй
Байгууллагын зохиогчид:	International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Формат:	Цахим Бага хурлын үйл явц Цахим ном
Хэл сонгох:	англи
Хэвлэсэн:	Materials Park, Ohio : ASM International, 2011.
Нөхцлүүд:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Онлайн хандалт:	An electronic book accessible through the World Wide Web; click to view
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!

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