ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
שמור ב:
Corporate Authors: | International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc |
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פורמט: | אלקטרוני Conference Proceeding ספר אלקטרוני |
שפה: | אנגלית |
יצא לאור: |
Materials Park, Ohio :
ASM International,
2011.
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נושאים: | |
גישה מקוונת: | An electronic book accessible through the World Wide Web; click to view |
תגים: |
הוספת תג
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
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פריטים דומים
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