ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Αποθηκεύτηκε σε:
Συλλογικό Έργο: | International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc |
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Μορφή: | Ηλεκτρονική πηγή Πρακτικό Συνεδρίου Ηλ. βιβλίο |
Γλώσσα: | Αγγλικά |
Έκδοση: |
Materials Park, Ohio :
ASM International,
2011.
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Θέματα: | |
Διαθέσιμο Online: | An electronic book accessible through the World Wide Web; click to view |
Ετικέτες: |
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ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
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