Electromigration in ULSI interconnections

VLSI test principles and architectures design for testability /
Wydane: (2006)

Terrestrial radiation effects in ULSI devices and electronic systems /
od: Ibe, Eishi H.
Wydane: (2015)

Terrestrial radiation effects in ULSI devices and electronic systems /
od: Ibe, Eishi H.
Wydane: (2015)

Power-constrained testing of VLSI circuits
od: Nicolici, Nicola
Wydane: (2003)

Power-constrained testing of VLSI circuits
od: Nicolici, Nicola
Wydane: (2003)

Mixed analog-digital VLSI devices and technology
od: Tsividis, Yannis
Wydane: (2002)

Mixed analog-digital VLSI devices and technology
od: Tsividis, Yannis
Wydane: (2002)

Design of analog-digital VLSI circuits for telecommunications and ... /
od: Franca, Jose E.
Wydane: (1994)

Design of analog-digital VLSI circuits for telecommunications and ... /
od: Franca, Jose E.
Wydane: (1994)

VLSI circuits for biomedical applications
Wydane: (2008)

VLSI circuits for biomedical applications
Wydane: (2008)

VLSI custom microelectronics digital, analog, and mixed-signal /
od: Hurst, S. L. (Stanley Leonard)
Wydane: (1999)

VLSI custom microelectronics digital, analog, and mixed-signal /
od: Hurst, S. L. (Stanley Leonard)
Wydane: (1999)

High performance devices proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices, Rensselaer Polytechnic Institute, 4-6 August 2004 /
Wydane: (2005)

High performance devices proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices, Rensselaer Polytechnic Institute, 4-6 August 2004 /
Wydane: (2005)

Verification by error modeling using testing techniques in hardware verification /
od: Radecka, Katarzyna
Wydane: (2003)

Verification by error modeling using testing techniques in hardware verification /
od: Radecka, Katarzyna
Wydane: (2003)

A one-semester course in modeling of VLSI interconnections /
od: Goel, Ashok K., 1953-
Wydane: (2015)

A one-semester course in modeling of VLSI interconnections /
od: Goel, Ashok K., 1953-
Wydane: (2015)

Advanced high speed devices
Wydane: (2010)

Advanced high speed devices
Wydane: (2010)

Wafer-level testing and test during burn-in for integrated circuits
od: Bahukudumbi, Sudarshan
Wydane: (2010)

Wafer-level testing and test during burn-in for integrated circuits
od: Bahukudumbi, Sudarshan
Wydane: (2010)

System-on-chip test architectures nanometer design for testability /
Wydane: (2008)

System-on-chip test architectures nanometer design for testability /
Wydane: (2008)

Mosfet modeling for VLSI simulation theory and practice /
od: Arora, N. (Narain), 1943-
Wydane: (2007)

Mosfet modeling for VLSI simulation theory and practice /
od: Arora, N. (Narain), 1943-
Wydane: (2007)

VLSI and computer architecture
Wydane: (2009)

VLSI and computer architecture
Wydane: (2009)

CMOS fractional-N synthesizers design for high spectral purity and monolithic integration /
od: Muer, Bram de
Wydane: (2003)

CMOS fractional-N synthesizers design for high spectral purity and monolithic integration /
od: Muer, Bram de
Wydane: (2003)

Understanding fabless IC technology
od: Hurtarte, Jeorge S.
Wydane: (2007)

Understanding fabless IC technology
od: Hurtarte, Jeorge S.
Wydane: (2007)

Broadband circuits for optical fiber communication
od: Säckinger, Eduard, 1959-
Wydane: (2005)

Broadband circuits for optical fiber communication
od: Säckinger, Eduard, 1959-
Wydane: (2005)

Integrated interconnect technologies for 3D nanoelectronic systems
Wydane: (2009)