Cita APA (7a ed.)
International Symposium for Testing and Failure Analysis Boston, Mass, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2004). ISTFA 2004: Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts. ASM International.
Cita Chicago Style (17a ed.)
International Symposium for Testing and Failure Analysis Boston, Mass, ASM International, Electronic Device Failure Analysis Society, y Inc ebrary. ISTFA 2004: Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts. Materials Park, OH: ASM International, 2004.
Cita MLA (9a ed.)
International Symposium for Testing and Failure Analysis Boston, Mass, et al. ISTFA 2004: Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts. ASM International, 2004.
Precaución: Estas citas no son 100% exactas.