Tohutoro APA (7th ed.)
International Symposium for Testing and Failure Analysis Portland, Or., ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2008). ISTFA 2008: Conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA. Asm International.
Tohutoru Kātū Chicago (17th ed.)
International Symposium for Testing and Failure Analysis Portland, Or., ASM International, Electronic Device Failure Analysis Society, me Inc ebrary. ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA. Materials Park, OH: Asm International, 2008.
Tohutoro MLA (9th ed.)
International Symposium for Testing and Failure Analysis Portland, Or., et al. ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA. Asm International, 2008.
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