ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Kaydedildi:
| Müşterek Yazar: | |
|---|---|
| Materyal Türü: | Elektronik Konferans Sunumu Ekitap |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
Materials Park, Ohio :
ASM International,
2014.
|
| Konular: | |
| Online Erişim: | An electronic book accessible through the World Wide Web; click to view |
| Etiketler: |
Etiketle
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MARC
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| 007 | cr cn||||||||| | ||
| 008 | 150109t20142014ohuao o 001 0 eng d | ||
| 020 | |z 9781627080743 | ||
| 020 | |a 9781627080750 (e-book) | ||
| 035 | |a (CaPaEBR)ebr10998999 | ||
| 035 | |a (OCoLC)900889018 | ||
| 040 | |a CaPaEBR |b eng |e rda |e pn |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871 |b .I884 2014eb |
| 082 | 0 | 4 | |a 621.381 |2 23 |
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (40th : |d 2014 : |c Houston, Tex.) | |
| 245 | 1 | 0 | |a ISTFA 2014 : |b conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / |c organized by Electronic Device Failure Analysis Society, ASM International. |
| 264 | 1 | |a Materials Park, Ohio : |b ASM International, |c 2014. | |
| 264 | 4 | |c ©2014 | |
| 300 | |a 1 online resource (560 pages) : |b color illustrations, photographs | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a computer |2 rdamedia | ||
| 338 | |a online resource |2 rdacarrier | ||
| 500 | |a Includes index. | ||
| 588 | |a Description based on online resource; title from PDF title page (ebrary, viewed January 9, 2014). | ||
| 590 | |a Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 0 | |a Electronic books. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society, |e organizer. | |
| 710 | 2 | |a ASM International, |e organizer. | |
| 776 | 0 | 8 | |i Print version: |a International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.) |t ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA. |d Materials Park, Ohio : ASM International, c2014 |h xx, 540 pages |z 9781627080743 |
| 797 | 2 | |a ebrary. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10998999 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 179382 |d 179382 | ||