Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Dades bibliogràfiques
Autors principals:	Servín, Manuel (Autor), Quiroga, J. Antonio (Autor), Padilla, J. Moises (Autor)
Format:	Electrònic eBook
Idioma:	anglès
Publicat:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Matèries:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
Accés en línia:	An electronic book accessible through the World Wide Web; click to view
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Fringe pattern analysis for optical metrology : theory, algorithms, and applications / per Servín, Manuel, Quiroga, J. Antonio, Padilla, J. Moises

Publicat 2014

An electronic book accessible through the World Wide Web; click to view

Electrònic eBook