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Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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书目详细资料
Main Authors: Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, J. Moises (Author)
格式: 电子 电子书
语言:英语
出版: Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
主题:
Diffraction patterns > Data processing.
Image processing > Data processing.
Electronic books.
在线阅读:An electronic book accessible through the World Wide Web; click to view
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实物特征
实物描述:1 online resource (345 pages) : illustrations
参考书目:Includes bibliographical references and index.
ISBN:9783527681082 (e-book)

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