Servín, M., Quiroga, J. A., & Padilla, J. M. (2014). Fringe pattern analysis for optical metrology: Theory, algorithms, and applications. Wiley-VCH Verlag GmbH & Co. KGaA.
Lua i Stíl Chicago (17ú heag.)Servín, Manuel, J. Antonio Quiroga, agus J. Moises Padilla. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Lua MLA (9ú heag.)Servín, Manuel, et al. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.