Cita APA (7th ed.)

Servín, M., Quiroga, J. A., & Padilla, J. M. (2014). Fringe pattern analysis for optical metrology: Theory, algorithms, and applications. Wiley-VCH Verlag GmbH & Co. KGaA.

Cita Chicago (17th ed.)

Servín, Manuel, J. Antonio Quiroga, i J. Moises Padilla. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2014.

Cita MLA (9th ed.)

Servín, Manuel, et al. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. Wiley-VCH Verlag GmbH & Co. KGaA, 2014.