Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /

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Bibliografske podrobnosti
Drugi avtorji: Nakamura, Syouji, Qian, Cun Hua, Chen, Mingchih
Format: Elektronski eKnjiga
Jezik:angleščina
Izdano: New Jersey : World Scientific, [2014]
Teme:
Online dostop:An electronic book accessible through the World Wide Web; click to view
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