Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /

Sábháilte in:
Sonraí bibleagrafaíochta
Rannpháirtithe: Nakamura, Syouji, Qian, Cun Hua, Chen, Mingchih
Formáid: Leictreonach Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: New Jersey : World Scientific, [2014]
Ábhair:
Rochtain ar líne:An electronic book accessible through the World Wide Web; click to view
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