Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /
Guardat en:
Altres autors: | Nakamura, Syouji, Qian, Cun Hua, Chen, Mingchih |
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Format: | Electrònic eBook |
Idioma: | anglès |
Publicat: |
New Jersey :
World Scientific,
[2014]
|
Matèries: | |
Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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