Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /

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Bibliographic Details
Other Authors: Nakamura, Syouji, Qian, Cun Hua, Chen, Mingchih
Format: Electronic eBook
Language:English
Published: New Jersey : World Scientific, [2014]
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Online Access:An electronic book accessible through the World Wide Web; click to view
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Description
Physical Description:1 online resource (379 pages) : illustrations
Bibliography:Includes bibliographical references.
ISBN:9789814571944 (e-book)