ebrary, Inc, & Claverie, A. (2013). Transmission electron microscopy in micro-nanoelectronics. John Wiley &Sons, Inc., ; ISTE.
Cita Chicago (17th ed.)ebrary, Inc, i A. Claverie. Transmission Electron Microscopy in Micro-nanoelectronics. Hoboken, N.J. : London: John Wiley &Sons, Inc., ; ISTE, 2013.
Cita MLA (9th ed.)ebrary, Inc, i A. Claverie. Transmission Electron Microscopy in Micro-nanoelectronics. John Wiley &Sons, Inc., ; ISTE, 2013.
Atenció: Aquestes cites poden no estar 100% correctes.