Lua APA (7ú heag.)
ebrary, Inc, Osten, W., & Reingand, N. (2012). Optical imaging and metrology: Advanced technologies. Wiley-VCH.
Lua i Stíl Chicago (17ú heag.)
ebrary, Inc, Wolfgang Osten, agus Nadya Reingand. Optical Imaging and Metrology: Advanced Technologies. Weinheim, Germany: Wiley-VCH, 2012.
Lua MLA (9ú heag.)
ebrary, Inc, et al. Optical Imaging and Metrology: Advanced Technologies. Wiley-VCH, 2012.
Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.