Cita APA (7a ed.)

Wong, T. K. S. (2012). Semiconductor strain metrology: Principles and applications. Bentham Science.

Cita Chicago Style (17a ed.)

Wong, Terence K. S. Semiconductor Strain Metrology: Principles and Applications. [Saif Zone, Sharjah, U.A.E] ; Oak Park, IL: Bentham Science, 2012.

Cita MLA (9a ed.)

Wong, Terence K. S. Semiconductor Strain Metrology: Principles and Applications. Bentham Science, 2012.