Polymers for electricity and electronics materials, properties, and applications /
"This book introduces readers to the fundamentals, basic principles, properties, and applications of electrical polymers. It provides the principles in an extended and accessible way, as well as including examples of state-of-the-art scientific issues. The book evaluates emerging technologies s...
Shranjeno v:
Glavni avtor: | Drobny, Jiri George |
---|---|
Korporativna značnica: | ebrary, Inc |
Format: | Elektronski eKnjiga |
Jezik: | angleščina |
Izdano: |
Hoboken, N.J. :
Wiley,
2012.
|
Teme: | |
Online dostop: | An electronic book accessible through the World Wide Web; click to view |
Oznake: |
Označite
Brez oznak, prvi označite!
|
Podobne knjige/članki
Electronic materials science
od: Irene, Eugene A.
Izdano: (2005)
od: Irene, Eugene A.
Izdano: (2005)
Electrical characterization of organic electronic materials and devices
od: Stallinga, Peter, 1966-
Izdano: (2009)
od: Stallinga, Peter, 1966-
Izdano: (2009)
Polymers for electronic components a Rapra industry analysis report /
od: Cousins, Keith
Izdano: (2001)
od: Cousins, Keith
Izdano: (2001)
Solid state electronic devices /
od: Streetman, Ben G.
Izdano: (2010)
od: Streetman, Ben G.
Izdano: (2010)
Single-electron devices and circuits in silicon
od: Durrani, Zahid Ali Khan
Izdano: (2010)
od: Durrani, Zahid Ali Khan
Izdano: (2010)
Polymer electronics a flexible technology /
Izdano: (2009)
Izdano: (2009)
ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Izdano: (2011)
Izdano: (2011)
ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Izdano: (2010)
Izdano: (2010)
ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Izdano: (1996)
Izdano: (1996)
ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Izdano: (2004)
Izdano: (2004)
ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Izdano: (2003)
Izdano: (2003)
ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Izdano: (1999)
Izdano: (1999)
ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Izdano: (2005)
Izdano: (2005)
ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Izdano: (1997)
Izdano: (1997)
ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Izdano: (1998)
Izdano: (1998)
ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Izdano: (2009)
Izdano: (2009)
ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Izdano: (2008)
Izdano: (2008)
ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Izdano: (2002)
Izdano: (2002)
ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Izdano: (2007)
Izdano: (2007)
ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Izdano: (2001)
Izdano: (2001)
ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Izdano: (2013)
Izdano: (2013)
ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Izdano: (2014)
Izdano: (2014)
ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Izdano: (2006)
Izdano: (2006)
ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Izdano: (2015)
Izdano: (2015)
Electronic components and processes
od: Maheshwari, Preeti
Izdano: (2006)
od: Maheshwari, Preeti
Izdano: (2006)
Guide to state-of-the-art electron devices
Izdano: (2013)
Izdano: (2013)
Electronic : devices and circuits /
od: Kulshreshtha, D. c.
Izdano: (2006)
od: Kulshreshtha, D. c.
Izdano: (2006)
Electrical engineering materials
od: Basak, T. K.
Izdano: (2012)
od: Basak, T. K.
Izdano: (2012)
Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
od: Karris, Steven T.
Izdano: (2012)
od: Karris, Steven T.
Izdano: (2012)
ESD circuits and devices /
od: Voldman, Steven H.
Izdano: (2006)
od: Voldman, Steven H.
Izdano: (2006)
Novel architectures for flexible electrochemical devices and systems
od: Kawahara, Jun
Izdano: (2013)
od: Kawahara, Jun
Izdano: (2013)
Electronic devices : a text and software problems manual /
od: Schultz, Mitchel E.
Izdano: (1994)
od: Schultz, Mitchel E.
Izdano: (1994)
Digital rubbish natural history of electronics /
od: Gabrys, Jennifer
Izdano: (2011)
od: Gabrys, Jennifer
Izdano: (2011)
Hertzian tales electronic products, aesthetic experience, and critical design /
od: Dunne, Anthony
Izdano: (2005)
od: Dunne, Anthony
Izdano: (2005)
Parts selection and management
Izdano: (2004)
Izdano: (2004)
A designer's guide to built-in self-test
od: Stroud, Charles E.
Izdano: (2002)
od: Stroud, Charles E.
Izdano: (2002)
ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Izdano: (2012)
Izdano: (2012)
ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Izdano: (2000)
Izdano: (2000)
Microelectronics failure analysis desk reference /
Izdano: (2011)
Izdano: (2011)
Microelectronic failure analysis desk reference.
Izdano: (2002)
Izdano: (2002)
Podobne knjige/članki
-
Electronic materials science
od: Irene, Eugene A.
Izdano: (2005) -
Electrical characterization of organic electronic materials and devices
od: Stallinga, Peter, 1966-
Izdano: (2009) -
Polymers for electronic components a Rapra industry analysis report /
od: Cousins, Keith
Izdano: (2001) -
Solid state electronic devices /
od: Streetman, Ben G.
Izdano: (2010) -
Single-electron devices and circuits in silicon
od: Durrani, Zahid Ali Khan
Izdano: (2010)