Electromigration in ULSI interconnections

VLSI test principles and architectures design for testability /
出版: (2006)

Terrestrial radiation effects in ULSI devices and electronic systems /
由: Ibe, Eishi H.
出版: (2015)

Terrestrial radiation effects in ULSI devices and electronic systems /
由: Ibe, Eishi H.
出版: (2015)

Power-constrained testing of VLSI circuits
由: Nicolici, Nicola
出版: (2003)

Power-constrained testing of VLSI circuits
由: Nicolici, Nicola
出版: (2003)

Mixed analog-digital VLSI devices and technology
由: Tsividis, Yannis
出版: (2002)

Mixed analog-digital VLSI devices and technology
由: Tsividis, Yannis
出版: (2002)

Design of analog-digital VLSI circuits for telecommunications and ... /
由: Franca, Jose E.
出版: (1994)

Design of analog-digital VLSI circuits for telecommunications and ... /
由: Franca, Jose E.
出版: (1994)

VLSI circuits for biomedical applications
出版: (2008)

VLSI circuits for biomedical applications
出版: (2008)

VLSI custom microelectronics digital, analog, and mixed-signal /
由: Hurst, S. L. (Stanley Leonard)
出版: (1999)

VLSI custom microelectronics digital, analog, and mixed-signal /
由: Hurst, S. L. (Stanley Leonard)
出版: (1999)

High performance devices proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices, Rensselaer Polytechnic Institute, 4-6 August 2004 /
出版: (2005)

High performance devices proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices, Rensselaer Polytechnic Institute, 4-6 August 2004 /
出版: (2005)

Verification by error modeling using testing techniques in hardware verification /
由: Radecka, Katarzyna
出版: (2003)

Verification by error modeling using testing techniques in hardware verification /
由: Radecka, Katarzyna
出版: (2003)

A one-semester course in modeling of VLSI interconnections /
由: Goel, Ashok K., 1953-
出版: (2015)

A one-semester course in modeling of VLSI interconnections /
由: Goel, Ashok K., 1953-
出版: (2015)

Advanced high speed devices
出版: (2010)

Advanced high speed devices
出版: (2010)

Wafer-level testing and test during burn-in for integrated circuits
由: Bahukudumbi, Sudarshan
出版: (2010)

Wafer-level testing and test during burn-in for integrated circuits
由: Bahukudumbi, Sudarshan
出版: (2010)

System-on-chip test architectures nanometer design for testability /
出版: (2008)

System-on-chip test architectures nanometer design for testability /
出版: (2008)

Mosfet modeling for VLSI simulation theory and practice /
由: Arora, N. (Narain), 1943-
出版: (2007)

Mosfet modeling for VLSI simulation theory and practice /
由: Arora, N. (Narain), 1943-
出版: (2007)

VLSI and computer architecture
出版: (2009)

VLSI and computer architecture
出版: (2009)

CMOS fractional-N synthesizers design for high spectral purity and monolithic integration /
由: Muer, Bram de
出版: (2003)

CMOS fractional-N synthesizers design for high spectral purity and monolithic integration /
由: Muer, Bram de
出版: (2003)

Understanding fabless IC technology
由: Hurtarte, Jeorge S.
出版: (2007)

Understanding fabless IC technology
由: Hurtarte, Jeorge S.
出版: (2007)

Alternative computer chips post-silicon circuits.
出版: (2003)

Computer chips post-Moore's-law possibilities.
出版: (2003)

Computer chips post-Moore's-law possibilities.
出版: (2003)