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Electromigration in ULSI interconnections

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Xehetasun bibliografikoak
Egile nagusia:	Tan, Cher Ming, 1959-
Erakunde egilea:	ebrary, Inc
Formatua:	Baliabide elektronikoa eBook
Hizkuntza:	ingelesa
Argitaratua:	Hackensack, N.J. : World Scientific, c2010.
Saila:	International series on advances in solid state electronics and technology.
Gaiak:	Integrated circuits > Ultra large scale integration. Electrodiffusion. Electronic books.
Sarrera elektronikoa:	An electronic book accessible through the World Wide Web; click to view
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Antzeko izenburuak

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Handbook of 3D integration.
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Radio frequency integrated circuit design
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Designing bipolar transistor radio frequency integrated circuits
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Radio-frequency integrated-circuit engineering /
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Lumped elements for RF and microwave circuits
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High-speed integrated circuit technology towards 100 GHz logic /
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