ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /

Spremljeno u:
Bibliografski detalji
Autori kompanije: International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Elektronički Izvještaj sastanka e-knjiga
Jezik:engleski
Izdano: Materials Park, Ohio : ASM International, 2010.
Teme:
Online pristup:An electronic book accessible through the World Wide Web; click to view
Oznake: Dodaj oznaku
Bez oznaka, Budi prvi tko označuje ovaj zapis!