ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /

Sábháilte in:
Sonraí bibleagrafaíochta
Údair chorparáideacha: International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formáid: Leictreonach Imeacht comhdhála Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: Materials Park, Ohio : ASM International, 2010.
Ábhair:
Rochtain ar líne:An electronic book accessible through the World Wide Web; click to view
Clibeanna: Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!