APA引文

International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2010). ISTFA 2010: Conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. ASM International.

Chicago Style (17th ed.) Citation

International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society, and Inc ebrary. ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. Materials Park, Ohio: ASM International, 2010.

MLA引文

International Symposium for Testing and Failure Analysis Dallas, Tex., et al. ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. ASM International, 2010.