Tohutoro APA (7th ed.)
ebrary, Inc, Kenett, R., & Raanan, Y. (2010). Operational risk management: A practical approach to intelligent data analysis. John Wiley & Sons.
Tohutoru Kātū Chicago (17th ed.)
ebrary, Inc, Ron Kenett, me Yossi Raanan. Operational Risk Management: A Practical Approach to Intelligent Data Analysis. Chichester ; [Hoboken]: John Wiley & Sons, 2010.
Tohutoro MLA (9th ed.)
ebrary, Inc, et al. Operational Risk Management: A Practical Approach to Intelligent Data Analysis. John Wiley & Sons, 2010.
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